K-diagnosability of labeled Petri nets

نویسندگان

  • Baisi Liu
  • Mohamed Ghazel
  • Armand Toguyéni
چکیده

This paper presents an approach to solve the problem of K-diagnosability of bounded labeled Petri nets (PNs). We first introduce extended incidence matrix, marking-eventing and extended state equation, which make it possible to record the number of event occurrences for any marking reachable from the initial one. Based on the proposed conceptions, we give a mathematical representation for labeled PNs to check diagnosability, and describe K-diagnosability problem of partially observed PNs. Then we propose a recursive algorithm for testing K-diagnosability of PNs, without construction of marking graph or diagnoser. Mots-clés : K-diagnosticabilité, systèmes à événements discrets, réseaux de Petri synchronisés

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تاریخ انتشار 2012